Nanofabrication Facility Equipment & Processes
Deposition
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PECVD
- Oxford Instruments PlasmaPro 80 Plasma Enhanced Chemical Vapor Deposition
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ALD
- Oxford Instruments FlexAL Atomic Layer Deposition
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Electron beam + thermal evaporator
- Kurt J. Lesker PVD200 evaporator
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LAB-18 Magnetron Sputtering System
- Kurt J. Lesker LAB-18
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CMS-18 Magnetron Sputtering System
- Kurt J. Lesker CMS-18
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ALD II
- Ultratech Fiji G2
Etching
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RIE
- Oxford Instruments PlasmaPro 80 Reactive Ion Etcher
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Plasma cleaner
- Harrick Plasma plasma cleaner
Wet processing
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Acid and Base bench
- Air-Control CS-50D High Performance Chemical Wet Process Station
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Solvent bench
- Air-Control Model 4F Exhausted Laminar Flow Chemical Wet Process Station
Lithography
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Mask aligner
- Karl Suss MA6 Gen 4 mask aligner
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Spin coater
- SPS Polos spin coater
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Hotplate
- SPS Polos hotplate
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Oven
- Some oven
NU Nanofab · Google Drive
Characterization
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Light Microscope
- Zeiss Axioscope 6 light microscope
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Profilometer
- Veeco Dektak XT profilometer
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XPS
- Thermo Scientific NEXSA X-ray Photoelectron Spectrometer
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Ellipsometer
- Sentech SENresearch 4.0 Spectroscopic Ellipsometer
- Area: 70 m2
- Classification: ISO 6 – ISO 5, with local ISO 4
- Toxic gas sensors: 6 pcs
- Oxygen sensors: 2 pcs
- Yellow room: 15 m3
- Technical area: 40 m3
Infrastructure:
- UHP inert gases, tech. N2, CDA, vacuum, DI water, chemicals neutralization system
- Cooling capacity:
- Air exchange:
- Electrical power capacity:
- Area: 152 m2
- Gases: UHP Ar, N2, O2. Technical N2, CDA
- Cooling Capacity: 22 kW (Ducted AC unit)
Instrument Capabilities:
- Magnetron sputtering system with 2” RF and 2x 2” DC sources
- Magnetron sputtering system with 3” RF, DC and pulsed DC sources
- Plasma enhanced atomic layer deposition system
- PECVD dual zone tube furnace
- Spectroscopic ellipsometer (190 nm - 2500 nm)
- Laminar box for clean environment sample handling