Nanofabrication Facility Equipment & Processes

Deposition

  1. PECVD - Oxford Instruments PlasmaPro 80 Plasma Enhanced Chemical Vapor Deposition
  2. ALD - Oxford Instruments FlexAL Atomic Layer Deposition
  3. Electron beam + thermal evaporator - Kurt J. Lesker PVD200 evaporator
  4. LAB-18 Magnetron Sputtering System - Kurt J. Lesker LAB-18
  5. CMS-18 Magnetron Sputtering System - Kurt J. Lesker CMS-18
  6. ALD II - Ultratech Fiji G2

Etching

  1. RIE - Oxford Instruments PlasmaPro 80 Reactive Ion Etcher
  2. Plasma cleaner - Harrick Plasma plasma cleaner

Wet processing

  1. Acid and Base bench - Air-Control CS-50D High Performance Chemical Wet Process Station
  2. Solvent bench - Air-Control Model 4F Exhausted Laminar Flow Chemical Wet Process Station

Lithography

  1. Mask aligner - Karl Suss MA6 Gen 4 mask aligner
  2. Spin coater - SPS Polos spin coater
  3. Hotplate - SPS Polos hotplate
  4. Oven - Some oven
NU Nanofab · Google Drive

Characterization

  1. Light Microscope - Zeiss Axioscope 6 light microscope
  2. Profilometer - Veeco Dektak XT profilometer
  3. XPS - Thermo Scientific NEXSA X-ray Photoelectron Spectrometer
  4. Ellipsometer - Sentech SENresearch 4.0 Spectroscopic Ellipsometer


The Cleanroom
  • Area: 70 m2
  • Classification: ISO 6 – ISO 5, with local ISO 4
  • Toxic gas sensors: 6 pcs
  • Oxygen sensors: 2 pcs
  • Yellow room: 15 m3
  • Technical area: 40 m3
Infrastructure:
  • UHP inert gases, tech. N2, CDA, vacuum, DI water, chemicals neutralization system
  • Cooling capacity:
  • Air exchange:
  • Electrical power capacity:
Thin film deposition laboratory
  • Area: 152 m2
  • Gases: UHP Ar, N2, O2. Technical N2, CDA
  • Cooling Capacity: 22 kW (Ducted AC unit)
Instrument Capabilities:
  • Magnetron sputtering system with 2” RF and 2x 2” DC sources
  • Magnetron sputtering system with 3” RF, DC and pulsed DC sources
  • Plasma enhanced atomic layer deposition system
  • PECVD dual zone tube furnace
  • Spectroscopic ellipsometer (190 nm - 2500 nm)
  • Laminar box for clean environment sample handling